Center for Analysis of Nanomaterials
The center provides characterization methods and equipment, as well as the skills needed for the accelerated development of nanotechnology products by Berlin SME's. Analytical measurements plus scientific and technical advice are available upon request.
- X-ray diffraction (XRD) for crystallographic studies (Bragg-Brentano, Parallel Beam with high temperature chamber for in-situ studies) coupled with XRF
- X-ray small angle scattering (SAXS) for the investigation of three-dimensional structures, particles and arrays of the order of 1 to 100 nm
- high resolution scanning electron microscope (SEM) coupled with EDX
- BET measurements to determine the surface area, e.g. of porous solids, by physisorption of N2 or Kr, determination of micro-pores and pore size distributions
- ICP-OES measurements (inductive coupled plasma) for elemental analysis
- HPLC-MS for liquid phase product analysis and GC for gas analysis
- head space electrochemical MS and in-situ DEMS (Differentially Pumped Mass Spectrometer)
- in-situ electrochemical FTIR (ATR and external reflection (IRRAS))
- microwave reactor, semibatch high pressure reactor, annealing flow furnaces
- MEA fuel cell test station
- rotating ring-disc electrode setups for electrochemical characterization by cyclic voltammetry, chronopotentiometry, amperometry, impedance measurements ....
Inquiries should be sent with a short problem description to the following e-mail address: firstname.lastname@example.org .
contactProf. Dr. Peter Strasser
the EECMS Laboratory
Chemical and Materials Engineering Division
Institute of Chemistry
sec. TC 03
Straße des 17. Juni 124