Center for Analysis of Nanomaterials

• X-ray diffraction (XRD) for crystallographic studies (Bragg-Brentano, Parallel Beam with high temperature chamber for in-situ studies) coupled with XRF
• X-ray small angle scattering (SAXS) for the investigation of three-dimensional structures, particles and arrays of the order of 1 to 100 nm
• high resolution scanning electron microscope (SEM) coupled with EDX
• BET measurements to determine the surface area, e.g. of porous solids, by physisorption of N₂ or Kr, determination of micro-pores and pore size distributions
• ICP-OES measurements (inductive coupled plasma) for elemental analysis
• HPLC-MS for liquid phase product analysis and GC for gas analysis
• head space electrochemical MS and in-situ DEMS (Differentially Pumped Mass Spectrometer)
• in-situ electrochemical FTIR (ATR and external reflection (IRRAS))
• microwave reactor, semibatch high pressure reactor, annealing flow furnaces
• MEA fuel cell test station
• rotating ring-disc electrode setups for electrochemical characterization by cyclic voltammetry, chronopotentiometry, amperometry, impedance measurements ....

Inquiries should be sent with a short problem description to the following e-mail address: pstrasser@tu-berlin.de [1].

Funded by the European Union to promote innovation and
knowledge-based economy (EFRE 20072013 2/19).